
IEC 61649 Ed. 1.0 b:1997
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
standard by International Electrotechnical Commission, 05/16/1997
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
standard by International Electrotechnical Commission, 05/16/1997
Electrostatics – Part 4-10: Standard test methods for specific applications – Two-point resistance measurement
standard by International Electrotechnical Commission, 11/22/2012
Optical fibre amplifiers – Basic specification – Part 1-1: Test methods for gain parameters – Optical spectrum analyzer
standard by International Electrotechnical Commission, 05/08/1998
Guide to specification of hydraulic turbine governing systems
standard by International Electrotechnical Commission, 04/20/2012
Lamp controlgear – Part 2-13: Particular requirements for d.c. ora.c. supplied electronic controlgear for LED modules CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 07/20/2016
Radiation protection instrumentation – Measurement of personal dose equivalents Hp(10) and Hp(0,07) for X, gamma, neutron and beta radiations – Direct reading personal dose equivalent meters
standard by International Electrotechnical Commission, 07/22/2010
Amendment 1 – Electrostatics – Part 4-1: Standard test methods for specific applications – Electrical resistance of floor coverings and installed floors
Amendment by International Electrotechnical Commission, 04/29/2015
Batch control – Part 2: Data structures and guidelines for languages
standard by International Electrotechnical Commission, 11/15/2001
Waveguide type dielectric resonators – Part 1-3: General information and test conditions – Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency
standard by International Electrotechnical Commission, 11/30/1999
Liquid crystal display devices – Part 30-5: Optical measuring methods of transmissive transparent LCD modules
standard by International Electrotechnical Commission, 01/18/2019