IEC 61954 Amd.2 Ed. 2.0 b:2017
Amendment 2 – Static var compensators (SVC) – Testing of thyristor valves
Amendment by International Electrotechnical Commission, 04/12/2017
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IEC 61784-5-18 Ed. 1.0 b:2013
Industrial communication networks – Profiles – Part 5-18: Installation of fieldbuses – Installation profiles for CPF 18
standard by International Electrotechnical Commission, 09/17/2013
IEC 61753-091-3 Ed. 1.0 b:2004
Fibre optic interconnecting devices and passive components performance standard – Part 091-3: Single mode fibre optic pigtailed style circulators for category U – Uncontrolled environment
standard by International Electrotechnical Commission, 05/27/2004
IEC 61747-3-1 Ed. 1.0 b:1998
Liquid crystal and solid-state display devices – Part 3-1: Liquid crystal display (LCD) cells – Blank detail specification
standard by International Electrotechnical Commission, 04/29/1998
IEC 61754-21 Ed. 1.0 b:2005
Fibre optic connector interfaces – Part 21: Type SMI connector family for plastic optical fibre
standard by International Electrotechnical Commission, 03/24/2005
IEC 61937-7 Amd.1 Ed. 2.0 b:2016
Amendment 1 – Digital audio – Interface for non-linear PCM encoded audio bitstreams applying IEC 60958 – Part 7: Non-linear PCM bitstreams according to the ATRAC, ATRAC2/3 and ATRAC-X formats
Amendment by International Electrotechnical Commission, 05/13/2016
IEC 61800-7-303 Ed. 2.0 b:2015
Adjustable speed electrical power drive systems – Part 7-303: Generic interface and use of profiles for power drive systems – Mapping of profile type 3 to network technologies
standard by International Electrotechnical Commission, 11/20/2015
IEC 61753-022-2 Ed. 2.0 b:2012
Fibre optic interconnecting devices and passive components – Performance standard – Part 022-2: Fibre optic connectors terminated on multimode fibre for category C – Controlled environment
standard by International Electrotechnical Commission, 11/15/2012
IEC 62041 Ed. 3.0 b:2017
Transformers, power supplies, reactors and similar products – EMC requirements
standard by International Electrotechnical Commission, 08/10/2017
IEC 62047-14 Ed. 1.0 b:2012
Semiconductor devices – Micro-electromechanical devices – Part 14: Forming limit measuring method of metallic film materials
standard by International Electrotechnical Commission, 02/28/2012