Semiconductor devices – Semiconductor devices for energy harvesting and generation – Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
standard by International Electrotechnical Commission, 02/27/2019
Electric cables – Halogen-free, low smoke, thermoplastic insulated and sheathed cables of rated voltages up to and including 450/750 V – Part 2: Test methods
standard by International Electrotechnical Commission, 02/13/2015
Alarm systems – Intrusion and hold-up systems – Part 4: Warning devices
standard by International Electrotechnical Commission, 10/07/2010
Charging cables for electric vehicles for rated voltages up to and including 0,6/1 kV – Part 1: General requirements
standard by International Electrotechnical Commission, 11/22/2017
Demonstration of dependability requirements – The dependability case
standard by International Electrotechnical Commission, 02/17/2015
Universal serial bus interfaces for data and power – Part 1-2: Common components – USB Power Delivery specification
standard by International Electrotechnical Commission, 06/22/2017
Residual current operated circuit-breakers for household and similar use – Part 1: Outline of blocks and modules for residual current device standards<br />
standard by International Electrotechnical Commission, 01/25/2017
Test method for erosion of wave soldering equipment using molten lead-free solder alloy – Part 2: Erosion test method for metal materials with surface processing
standard by International Electrotechnical Commission, 07/13/2016
Measurement method of a half-wavelength voltage and a chirp parameter for Mach-Zehnder optical modulator in high-frequency radio on fibre (RoF) systems
standard by International Electrotechnical Commission, 07/27/2017
Semiconductor devices – Semiconductor interface for human body communication – Part 3: Functional type and its operational conditions
standard by International Electrotechnical Commission, 04/26/2016