IEEE 300-1988

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Revision Standard – Active.This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators)which may not be readily available. Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988

Product Details

Published:

12/29/1988

ISBN(s):

0738106747, 9780738106748

Number of Pages:

35

File Size:

1 file , 460 KB

Product Code(s):

STD12286