
JEDEC JEP174
UNDERSTANDING ELECTRICAL OVERSTRESS – EOS
standard by JEDEC Solid State Technology Association, 09/01/2016
UNDERSTANDING ELECTRICAL OVERSTRESS – EOS
standard by JEDEC Solid State Technology Association, 09/01/2016
Graphics Double Data Rate (GDDR5) SGRAM Standard
standard by JEDEC Solid State Technology Association, 09/01/2013
AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS
standard by JEDEC Solid State Technology Association, 03/01/2017
INDEX OF TERMS DEFINED IN JEDEC PUBLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2000
SON/QFN PACKAGE PINOUTS STANDARDIZED FOR 1-, 2-, AND 3-BIT LOGIC FUNCTIONS
standard by JEDEC Solid State Technology Association, 07/01/2004
CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY SEMICONDUCTOR SUPPLIERS
standard by JEDEC Solid State Technology Association, 10/01/2006
GUIDELINES FOR PREPARING CUSTOMER-SUPPLIED BACKGROUND INFORMATION RELATING TO A SEMICONDUCTOR-DEVICE FAILURE ANALYSIS
standard by JEDEC Solid State Technology Association, 09/01/1998
CHIP CARRIER PINOUTS STANDARDIZED FOR CMOS 4000, HC AND HCT SERIES OF LOGIC CIRCUITS
standard by JEDEC Solid State Technology Association, 12/01/1984
Byte Addressable Energy Backed Interface
standard by JEDEC Solid State Technology Association, 07/01/2017
WIRE BOND SHEAR TEST
standard by JEDEC Solid State Technology Association, 08/01/2009