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JEDEC JESD92

PROCEDURE FOR CHARACTERIZING TIME-DEPENDENT DIELECTRIC BREAKDOWN OF ULTRA-THIN GATE DIELECTRICS
standard by JEDEC Solid State Technology Association, 08/01/2003

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JEDEC JESD89-2A

TEST METHOD FOR ALPHA SOURCE ACCELERATED SOFT ERROR RATE
standard by JEDEC Solid State Technology Association, 10/01/2007

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JEDEC JESD8-30

POD125 – 1.25 V PSEUDO OPEN DRAIN I/O
standard by JEDEC Solid State Technology Association, 09/01/2017

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JEDEC JESD8-22B

HSUL_12 LPDDR2 and LPDDR3 I/O with Optional ODT
standard by JEDEC Solid State Technology Association, 04/01/2014

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JEDEC JESD84-B45

Embedded Multi-media card (e*MMC), Electrical Standard (4.5 Device)
standard by JEDEC Solid State Technology Association, 06/01/2011

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JEDEC JESD8-21

POD135 – 1.35 V PSEUDO OPEN DRAIN I/O
standard by JEDEC Solid State Technology Association, 07/01/2010

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JEDEC JESD96A

RADIO FRONT END – BASEBAND (RF-BB) INTERFACE
standard by JEDEC Solid State Technology Association, 02/01/2006

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JEDEC JS-002-2014

ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device MOdel (CDM) – Device Level
standard by JEDEC Solid State Technology Association, 04/07/2015

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JEDEC JS 9704

IPC/JEDEC-9704: Printed Wiring Board (PWB) Strain Gage Test Guideline
standard by JEDEC Solid State Technology Association, 06/01/2005