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JEDEC JESD22-A101D

STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
standard by JEDEC Solid State Technology Association, 07/01/2015

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JEDEC JESD 12-4

ADDENDUM No. 4 to JESD12 – METHOD OF SPECIFICATION OF PERFORMANCE PARAMETERS FOR CMOS SEMICUSTOM INTEGRATED CIRCUITS
Amendment by JEDEC Solid State Technology Association, 04/01/1987

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JEDEC JESD229-2

WIDE I/O 2 (WideIO2)
standard by JEDEC Solid State Technology Association, 08/01/2014

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JEDEC JESD22-B114A

Mark Legibility
standard by JEDEC Solid State Technology Association, 05/01/2011

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JEDEC JESD84-C43

EMBEDDED MULTIMEDIACARD (e*MMC)MECHANICAL STANDARD
standard by JEDEC Solid State Technology Association, 12/01/2007

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JEDEC JESD 82-24

DEFINITION OF the SSTUB32865 28-bit 1:2 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007

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JEDEC JESD211

ZENER AND VOLTAGE REGULATOR DIODE RATING VERIFICATION AND CHARACTERIZATION TESTING
standard by JEDEC Solid State Technology Association, 12/01/2009

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JEDEC JESD82-32

DDR4 DATA BUFFER DEFINITION (DDR4DB01)
standard by JEDEC Solid State Technology Association,

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JEDEC JEP151

, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
standard by JEDEC Solid State Technology Association, 12/01/2015

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JEDEC J-STD-033B.1

JOINT IPC/JEDEC STANDARD FOR HANDLING, PACKING, SHIPPING AND USE OF MOISTURE/REFLOW SENSITIVE SURFACE-MOUNT DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2007