
JEDEC JESD9C
Inspection Criteria for Microelectronic Packages and Covers
standard by JEDEC Solid State Technology Association, 05/01/2017
Inspection Criteria for Microelectronic Packages and Covers
standard by JEDEC Solid State Technology Association, 05/01/2017
POD18 – 1.8 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 12/01/2006
POD125 – 1.25 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 06/01/2019
Addendum No. 1 to JESD251, Optional x4 Quad I/O With Data Strobe
Amendment by JEDEC Solid State Technology Association, 10/01/2018
TEMPERATURE CYCLING
standard by JEDEC Solid State Technology Association, 03/01/2009
LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM STANDARD
standard by JEDEC Solid State Technology Association, 02/01/2010
METHOD OF DIODE Q MEASUREMENT
standard by JEDEC Solid State Technology Association, 11/01/1981
FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 03/01/2009
LOW TEMPERATURE STORAGE LIFE
standard by JEDEC Solid State Technology Association, 11/01/2004
RESISTANCE TO SOLDER SHOCK FOR THROUGH-HOLE MOUNTED DEVICES
standard by JEDEC Solid State Technology Association, 04/01/2008