JEDEC JESD213A
STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) – LEAD (Pb) CONTENT
standard by JEDEC Solid State Technology Association, 04/01/2017
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JEDEC JESD209-3B
Low Power Double Data Rate 3 SDRAM (LPDDR3)
standard by JEDEC Solid State Technology Association, 08/01/2013
JEDEC JS709C
Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products
standard by JEDEC Solid State Technology Association, 03/01/2018
JEDEC JESD229
Wide I/O Single Data Rate (Wide I/O SDR)
standard by JEDEC Solid State Technology Association, 12/01/2011
JEDEC JEP139
GUIDELINE FOR CONSTANT TEMPERATURE AGING TO CHARACTERIZE ALUMINUM INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING
standard by JEDEC Solid State Technology Association, 12/01/2000
JEDEC JESD 82-25
DEFINITION OF the SSTUB32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007
JEDEC JESD218B.01
SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD
standard by JEDEC Solid State Technology Association, 06/01/2016
JEDEC JESD 236-C (R2009)
COLOR CODING OF DISCRETE SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 03/01/1986
JEDEC JEP 148A
RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 12/01/2008
JEDEC JESD51-52
Guidelines for Combining CIE 127-2007 Total Flux Measurements with Thermal Measurements of LEDs with Exposed Cooling Surface
standard by JEDEC Solid State Technology Association, 04/01/2012