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JEDEC JESD8-21C
POD135 – 1.35 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 06/01/2019
JEDEC JESD87
STANDARD TEST STRUCTURE FOR RELIABILITY ASSESSMENT OF AlCu METALLIZATIONS WITH BARRIER MATERIALS
standard by JEDEC Solid State Technology Association, 07/01/2001
JEDEC JESD51-2A
INTEGRATED CIRCUITS THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – NATURAL CONVECTION (STILL AIR)
standard by JEDEC Solid State Technology Association, 01/01/2007
JEDEC JESD30G
Descriptive Designation System for Semiconductor-device Packages
standard by JEDEC Solid State Technology Association, 01/01/2016
JEDEC JS-001-2017
ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing – Human Body Modal (HBM) – Component Level
standard by JEDEC Solid State Technology Association, 05/12/2017
JEDEC JESD51-53
TERMS, DEFINITIONS AND UNITS GLOSSARY FOR LED THERMAL TESTING
standard by JEDEC Solid State Technology Association, 05/01/2012
JEDEC JESD419-A (R2001)
STANDARD LIST OF VALUES TO BE USED IN SEMICONDUCTOR DEVICE SPECIFICATIONS AND REGISTRATION FORMAT
standard by JEDEC Solid State Technology Association, 10/01/1980
JEDEC JESD4 (R2002)
DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES
standard by JEDEC Solid State Technology Association, 11/01/1983
JEDEC JESD6 (R2002)
MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
standard by JEDEC Solid State Technology Association, 02/01/1967