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JEDEC JEP150.01

STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTS
standard by JEDEC Solid State Technology Association, 06/01/2013

JEDEC JESD 12-5

ADDENDUM No. 5 to JESD12 – DESIGN FOR TESTABILITY GUIDELINES
Amendment by JEDEC Solid State Technology Association, 08/01/1988

JEDEC JEP122G

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 10/01/2011

JEDEC JEP133C

GUIDE FOR THE PRODUCTION AND ACQUISITION OF RADIATION-HARDNESS ASSURED MULTICHIP MODULES AND HYBRID MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 01/01/2010

JEDEC JESD 35-2

ADDENDUM No. 2 to JESD35 – TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 02/01/1996