JEDEC JESD 12-2
ADDENDUM No. 2 to JESD12 – STANDARD FOR CELL-BASED INTEGRATED CIRCUIT BENCHMARK SET
Amendment by JEDEC Solid State Technology Association, 02/01/1986
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JEDEC JESD22-B104C (R2009)
MECHANICAL SHOCK
standard by JEDEC Solid State Technology Association, 11/01/2004
JEDEC JEP170
Guidelines for Visual Inspection and Control of Flip Chip Type Components (FCxGA)
standard by JEDEC Solid State Technology Association, 01/01/2013
JEDEC JESD 35-1
ADDENDUM No. 1 to JESD35 – GENERAL GUIDELINES FOR DESIGNING TEST STRUCTURES FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 09/01/1995
JEDEC JESD204A
SERIAL INTERFACE FOR DATA CONVERTERS
standard by JEDEC Solid State Technology Association, 04/01/2008
JEDEC JEP131C
Potential Failure Mode and Effects Analysis (FMEA)
standard by JEDEC Solid State Technology Association, 08/01/2018
JEDEC JESD 370B (R2003)
DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 02/01/1982
JEDEC JESD22-B116B
WIRE BOND SHEAR TEST
standard by JEDEC Solid State Technology Association, 04/01/2017
JEDEC JEP84A
RECOMMENDED PRACTICE FOR MEASUREMENT OF TRANSISTOR LEAD TEMPERATURE
standard by JEDEC Solid State Technology Association, 06/01/2004