
JEDEC JESD 471 (R2009)
SYMBOL AND LABEL FOR ELECTROSTATIC SENSITIVE DEVICES
standard by JEDEC Solid State Technology Association,
SYMBOL AND LABEL FOR ELECTROSTATIC SENSITIVE DEVICES
standard by JEDEC Solid State Technology Association,
GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING
standard by JEDEC Solid State Technology Association, 12/01/2018
MARKING PERMANENCY
standard by JEDEC Solid State Technology Association, 09/01/2004
Addendum No. 1 to JESD209-4 – Low Power Double Data Rate 4 (LPDDR4)
Amendment by JEDEC Solid State Technology Association, 01/01/2017
DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 02/01/1982
WIRE BOND SHEAR TEST
standard by JEDEC Solid State Technology Association, 04/01/2017
RECOMMENDED PRACTICE FOR MEASUREMENT OF TRANSISTOR LEAD TEMPERATURE
standard by JEDEC Solid State Technology Association, 06/01/2004
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 04/01/2010
SERIAL INTERFACE FOR DATA CONVERTERS
standard by JEDEC Solid State Technology Association, 04/01/2008